High Power X-ray Generator for Xafs Experiments

X-ray absorption fine structure (XAFS) provides information on the atomic-scale structure around a specific atom, and has become an essential analytical tool in materials, biology and many other sciences [1, 2]. The availability of a synchrotron source has facilitated the application of XAFS, because a strong smooth spectral distribution is important for the measurements, and synchrotron radiation is eminently suitable. However, as is often the case in materials study, the difficulty in obtaining quick feedback ready for the next sample preparation is one of the big disadvantages. In addition, as the number of scientists involved in this field increases rapidly, many problems, including the strictly limited beam time of the facility become significant.